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Semiannual Review of Research under the Associate Joint Services Electronics Program


The following report represents the second semiannual review of research conducted under the auspices of the associate joint services electronics program at the institute for electronic science at Texas Tech University. Specific topics covered include fault analysis, computer-aided design, stochasti......

【作者名称】: Saeks, R, Chao, K S, Liberty, S R
【关 键 词】: ELECTRONICS, COMPUTER AIDED DESIGN, PATTERN RECOGNITION, OPTICAL PROCESSING, STOCHASTIC CONTROL, FAULT TREE ANALYSIS
【网站名称】: 美国国防技术信息中心
【期刊论文数据库】: [DBS_Articles_05]
【期刊论文编号】: 189,355,288
【摘要长度】: 425
【栏目名称】: 所有文件
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